Fundamentals and Characterization
Failure Analysis and Prevention
Organizer: Tom Ackerson, IMR Metallurgical Services
Frontiers of Materials Science: Fundamentals of Porous Materials from Development to Applications
Organizers: Nitin Chopra, University of Alabama; Ramana G Reddy, The University of Alabama; Chandra S Pande, Naval Research Laboratory; Corbett Battaile, Sandia National Laboratories
Fundamental Understanding of High-Entropy Alloy Formation and their Properties
Organizers: Michael Gao, National Energy Technology Lab; Peter K. Liaw, University of Tennessee
In-situ Characterization of Phase Transformations in Materials
Organizers: Sudarsanam Babu, The Ohio State University; Eliot D Specht, Oak Ridge National Laboratory; Neal D Evans, The University of Tennessee; Yu U. Wang, Michigan Technological University; Thomas Kannengiesser, BAM Federal Institute of Materials Research and Testing; Yu-Ichi Komizo, Osaka University; Antonio J. Ramirez, Brazilian Synchrotron Light Laboratory – CNPEM/ABTLuS
Integrated Computational Materials Engineering: The Customer’s Point of View
Organizers: Rollie Dutton, Air Force Research Laboratory; David Furrer, Pratt & Whitney
Microstructure Based Property Prediction and Small Scale Experimental Validation
Organizers: Xin Sun, Pacific Northwest National Laboratory; Nicholas Barbosa, NIST Boulder Labs
Multi-scale Modeling of Microstructure Deformation in Material Processing
Organizers: Roman Kuziak, Institute for Ferrous Metallurgy in Gliwice; Maciej Pietrzyk, Akademia Gorniczo-Hutnicza; Lukasz Madej, Akademia Gorniczo Hutnicza
Phase Stability, Diffusion, Kinetics and their Applications (PSDK-VII)
Organizers: Abhijeet Misra, QuesTek Innovations LLC; Jeffrey LaCombe, University of Nevada, Reno; Raymundo Arroyave, Texas A&M University; Yong-Ho Sohn, University of Central Florida; Sudarsanam Suresh Babu, The Ohio State University
Quantification of Texture and Microstructure Gradients in Polycrystalline Materials
Organizers: David Field, Washington State University; Alexis Lewis, Naval Research Lab; A. D. (Tony) Rolleltt, Carnegie Mellon University; Stuart Wright, TSL/EDAX/Ametek