The scale of experimental measurements of the distortion of a material has dramatically decreased in recent years. Parallel advances in techniques for measuring the distortion of crystal lattices by diffraction techniques provide a heretofore-unavailable opportunity for using the relationships between lattice distortion, total shape distortion and dislocation distortion to gain insight into dislocation behavior at the micro- and nano-scale. This paper discusses three points in an effort to clarify the relationships among various quantities that can be measured and to address the physical interpretation of relevant quantities.

This paper is included in TMS Letters,Vol. 1:1 (2004).

Publisher: TMS
Product Format: PDF
Pages: 11-12
Date Published: January 1, 2004